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http://www.onsolution.com.au/
Temperature logging, weather monitoring, ethylene control and customised software.
Keywords:
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http://www.ais-dresden.de/
Manufacturing automation and information technology solutions for the semiconductors, plastics, vacuum technology and railway industries.
Keywords: 300mm, automation, bahnhof, ctc, cell, cluster, control, controller, datenarchivierung, diagnostic, dresden, entwicklung, equipment, fablink, fabrik, g-ra, gem, halbleiter, halbleiterindustrie, integration, interface, leitrechner, leitsystem, leittechnik, maschine, monitoring, montagelinien, nt/32, programmierung, prozess, remote, secs, semi, sps, soft, software, standard, steuerungen, system, tfm, technik, tool, vac, vat, vctc, vecc, vlc, vmec, vrc, vakuumtechnik, visualisierung, semiconductor, service, ais
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http://www.wonderware.com/
Integrated software to link sensors (PLCs) to enterprise (ERP) software.
Keywords: plant management, 21 cfr part 11 software, hmi, hmi software, mes software, opc, plc software, scada, spc software, automotive, batch management, chemical, control system, data aquisition, downtime analysis software, food & beverage, historical trending, industrial automation, manufacturing, manufacturing software, mining, oil & gas, pc control software, pharmaceutical, plant floor data, plant historian, portal software, pulp & paper, quality control software, resource trending, semiconductors, terminal services, thin client software, utilities
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http://www.pintailtechnologies.com/
Offers software and consulting for the implementation of statisical process control in the semiconductor industry.
Keywords: cpk, pintail, pintail technologies, spcmonitor, spcrealtime, spctest, std, stdf, stdf 3, stdf 4, stdf conversion, stdf conversions, stdf convert, stdf converter, stdf converters, bell curve, circuit, control, converting stdf, histogram, integrated test, limits, mean, median, mixed signal, parametric, probe, range, semiconductor test, semiconductor testing, semiconductors, statistical analysis, statistical control, statistical process, statistical process control, statistical processes, stdf, testing, trending, trends, wafer, test
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